[PDF.50qj] An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)

[PDF.az54] An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)

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 | #4627844 in Books |  imusti |  2015-10-16 | Original language:English | PDF # 1 |  10.00 x.18 x7.01l,.40 | File type: PDF | 66 pages

 | Morgan Claypool

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||About the Author|Dr. Sarah Fearn is a Research Officer, Surface Analysis, in the Materials Department at Imperial College London where she conducts near-surface analysis of SOFCs and ionic conductivity measurements on nano-engineered structures. Her current rese

This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were fi...

You can specify the type of files you want, for your device.An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)   |  Sarah Fearn. A good, fresh read, highly recommended.

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