[PDF.21ie] Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

[PDF.yt54] Characterization of High Tc Materials and Devices by Electron Microscopy

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 | #4366707 in eBooks |  2000-07-06 |  2000-07-06 | File type: PDF

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|| |'... a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chap...

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