[PDF.93oh] Quantitative TEM Study of Nitride Semiconductors: Quantitative transmission electron microscopy study of III-nitride semiconductor nanostructures (Omn.Univ.Europ.)

Quantitative TEM Study of Nitride Semiconductors: Quantitative transmission electron microscopy study of III-nitride semiconductor nanostructures (Omn.Univ.Europ.)

[PDF.nj70] Quantitative TEM Study of Nitride Semiconductors: Quantitative transmission electron microscopy study of III-nitride semiconductor nanostructures (Omn.Univ.Europ.)

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 | #14905072 in Books |  2010-11-12 | Original language:English | PDF # 1 |  8.66 x.45 x5.91l,.65 | File type: PDF | 196 pages

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||About the Author|Maxim Korytov was born in Sankt-Petersburg in 1981. He graduated from Saint-Petersburg State Polytechnical University in 2004, then he worked in the Ioffe Physical-Technical Institute. In 2007 he went to the CRHEA-CNRS laboratory (France) to p

The theoretical part of this work is dedicated to the adaptation of high-resolution transmission electron microscopy for studying III-nitride semiconductors. First, the principle of heterostructure composition evaluation by means of atomic displacement measurement is stated. The comparison of two strain measurement techniques, geometric phase analysis and projection method, is then presented. Finally, the effects of acquisition conditions on the strain measureme...

You can specify the type of files you want, for your gadget.Quantitative TEM Study of Nitride Semiconductors: Quantitative transmission electron microscopy study of III-nitride semiconductor nanostructures (Omn.Univ.Europ.)   |  Maxim Korytov. I was recommended this book by a dear friend of mine.

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