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| 2015-03-17 | Original language:English | PDF # 1 | 9.02 x.69 x5.98l,1.23 | File type: PDF | 292 pages|
Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures in...
You easily download any file type for your gadget.Scanning Electron Microscopy | From NY RESEARCH PRESS.Not only was the story interesting, engaging and relatable, it also teaches lessons.
