[PDF.16ak] Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

[PDF.td03] Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

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 | #5218870 in Books |  2000-12-13 | Original language:English | PDF # 1 |  9.31 x.78 x6.28l,1.69 | File type: PDF | 288 pages

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|| |"This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure." (SciTech Book News Vol. 25, No. 2 June 2001)|Read Online Now